Rahul Nadkarni, Igor Arsovski, Reid Wistort, Valerie Chickanosky. Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]
Abstract is missing.