Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams. Defect Analysis and a New Fault Model for Multi-port SRAMs. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 366-374, IEEE Computer Society, 2001. [doi]
@inproceedings{NagarajUZA01,
title = {Defect Analysis and a New Fault Model for Multi-port SRAMs},
author = {Pradeep Nagaraj and Shambhu Upadhaya and Kamran Zarrineh and R. Dean Adams},
year = {2001},
url = {http://computer.org/proceedings/dft/1203/12030366abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/NagarajUZA01},
cites = {0},
citedby = {0},
pages = {366-374},
booktitle = {16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1203-8},
}