Defect Analysis and a New Fault Model for Multi-port SRAMs - researchr publication related

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Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams. Defect Analysis and a New Fault Model for Multi-port SRAMs. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 366-374, IEEE Computer Society, 2001. [doi]

The following publications are possibly variants of this publication:

Defect Analysis and Defect Tolerant Design of Multi-port SRAMsLushan Liu, Pradeep Nagaraj, Shambhu Upadhyaya, Ramalingam Sridhar. et, 24(1-3):165-179, 2008. [doi]

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