Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams. Defect Analysis and a New Fault Model for Multi-port SRAMs. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 366-374, IEEE Computer Society, 2001.
Abstract is missing.