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Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor. Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]

Authors

Sarath Mohanachandran Nair

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Rajendra Bishnoi

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Mehdi Baradaran Tahoori

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Houman Zahedmanesh

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Kristof Croes

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Kevin Garello

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Gouri Sankar Kar

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Francky Catthoor

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