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M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara. Reliability of polycrystalline silicon thin film resistors. Microelectronics Reliability, 41(9-10):1341-1346, 2001.
Abstract is missing.