Accelerated Test Points Selection Method for Scan-Based BIST

Michinobu Nakao, Kazumi Hatayama, Isao Higashi. Accelerated Test Points Selection Method for Scan-Based BIST. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 359, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.