Michinobu Nakao, Seiji Kobayashi, Kazumi Hatayama, Kazuhiko Iijima, Seiji Terada. Low overhead test point insertion for scan-based BIST. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 348-357, IEEE Computer Society, 1999.
Abstract is missing.