Takashi Nanya, Samiha Mourad, Edward J. McCluskey. Multiple stuck-at fault testability of self-testing checkers. In Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988. pages 381-386, IEEE Computer Society, 1988. [doi]
@inproceedings{NanyaMM88,
title = {Multiple stuck-at fault testability of self-testing checkers},
author = {Takashi Nanya and Samiha Mourad and Edward J. McCluskey},
year = {1988},
doi = {10.1109/FTCS.1988.5347},
url = {http://dx.doi.org/10.1109/FTCS.1988.5347},
researchr = {https://researchr.org/publication/NanyaMM88},
cites = {0},
citedby = {0},
pages = {381-386},
booktitle = {Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988},
publisher = {IEEE Computer Society},
isbn = {0-8186-0867-6},
}