Takashi Nanya, Samiha Mourad, Edward J. McCluskey. Multiple stuck-at fault testability of self-testing checkers. In Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988. pages 381-386, IEEE Computer Society, 1988. [doi]
Abstract is missing.