Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod. An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.