Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer. Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers, 23(5):390-400, 2006. [doi]
@article{NelsonZBPBMBS06,
title = {Extracting Defect Density and Size Distributions from Product ICs},
author = {Jeffrey E. Nelson and Thomas Zanon and Jason G. Brown and Osei Poku and R. D. (Shawn) Blanton and Wojciech Maly and Brady Benware and Chris Schuermyer},
year = {2006},
doi = {10.1109/MDT.2006.117},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117},
researchr = {https://researchr.org/publication/NelsonZBPBMBS06},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {23},
number = {5},
pages = {390-400},
}