Extracting Defect Density and Size Distributions from Product ICs - researchr publication related

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Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer. Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers, 23(5):390-400, 2006. [doi]

The following publications are possibly variants of this publication:

Extraction of defect density and size distributions from wafer sort test resultsJeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton. date 2006: 913-918 [doi]

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