Asynchronous interleaved scan architecture for on-line built-in self-test of null convention logic - researchr publication authors

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Nastaran Nemati, Mark C. Reed, Karl M. Fant, Paul Beckett. Asynchronous interleaved scan architecture for on-line built-in self-test of null convention logic. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 746-749, IEEE, 2016. [doi]

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