Nastaran Nemati, Mark C. Reed, Karl M. Fant, Paul Beckett. Asynchronous interleaved scan architecture for on-line built-in self-test of null convention logic. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 746-749, IEEE, 2016. [doi]
@inproceedings{NematiRFB16,
title = {Asynchronous interleaved scan architecture for on-line built-in self-test of null convention logic},
author = {Nastaran Nemati and Mark C. Reed and Karl M. Fant and Paul Beckett},
year = {2016},
doi = {10.1109/ISCAS.2016.7527348},
url = {http://dx.doi.org/10.1109/ISCAS.2016.7527348},
researchr = {https://researchr.org/publication/NematiRFB16},
cites = {0},
citedby = {0},
pages = {746-749},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016},
publisher = {IEEE},
isbn = {978-1-4799-5341-7},
}