Nastaran Nemati, Mark C. Reed, Karl M. Fant, Paul Beckett. Asynchronous interleaved scan architecture for on-line built-in self-test of null convention logic. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 746-749, IEEE, 2016. [doi]
Abstract is missing.