Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin. A new design-for-test technique for SRAM core-cell stability faults. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1344-1348, IEEE, 2009. [doi]
Abstract is missing.