A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 97-104, IEEE Computer Society, 2007. [doi]
Abstract is missing.