Analysis of Resistive-Open Defects in SRAM Sense Amplifiers

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. VLSI Syst., 17(10):1556-1559, 2009. [doi]

Abstract

Abstract is missing.