Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime - researchr publication authors

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H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper. Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability, 42(9-11):1421-1425, 2002. [doi]

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