External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues

Koji Nii, Yasumasa Tsukamoto, Yuichiro Ishii, Makoto Yabuuchi, Hidehiro Fujiwara, Kazuyoshi Okamoto. A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 246-251, IEEE Computer Society, 2012. [doi]

Authors

Koji Nii

This author has not been identified. Look up 'Koji Nii' in Google

Yasumasa Tsukamoto

This author has not been identified. Look up 'Yasumasa Tsukamoto' in Google

Yuichiro Ishii

This author has not been identified. Look up 'Yuichiro Ishii' in Google

Makoto Yabuuchi

This author has not been identified. Look up 'Makoto Yabuuchi' in Google

Hidehiro Fujiwara

This author has not been identified. Look up 'Hidehiro Fujiwara' in Google

Kazuyoshi Okamoto

This author has not been identified. Look up 'Kazuyoshi Okamoto' in Google
runs on