Koji Nii, Yasumasa Tsukamoto, Yuichiro Ishii, Makoto Yabuuchi, Hidehiro Fujiwara, Kazuyoshi Okamoto. A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 246-251, IEEE Computer Society, 2012. [doi]
@inproceedings{NiiTIYFO12,
title = {A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues},
author = {Koji Nii and Yasumasa Tsukamoto and Yuichiro Ishii and Makoto Yabuuchi and Hidehiro Fujiwara and Kazuyoshi Okamoto},
year = {2012},
doi = {10.1109/ATS.2012.59},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.59},
researchr = {https://researchr.org/publication/NiiTIYFO12},
cites = {0},
citedby = {0},
pages = {246-251},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}