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A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues

Koji Nii, Yasumasa Tsukamoto, Yuichiro Ishii, Makoto Yabuuchi, Hidehiro Fujiwara, Kazuyoshi Okamoto. A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 246-251, IEEE Computer Society, 2012. [doi]

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