Hideyuki Noda, Katsumi Dosaka, Hans Jürgen Mattausch, Tetsushi Koide, Fukashi Morishita, Kazutami Arimoto. A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC. IEICE Transactions, 89-C(11):1612-1619, 2006. [doi]
@article{NodaDMKMA06,
title = {A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC},
author = {Hideyuki Noda and Katsumi Dosaka and Hans Jürgen Mattausch and Tetsushi Koide and Fukashi Morishita and Kazutami Arimoto},
year = {2006},
doi = {10.1093/ietele/e89-c.11.1612},
url = {http://dx.doi.org/10.1093/ietele/e89-c.11.1612},
tags = {architecture, reliability},
researchr = {https://researchr.org/publication/NodaDMKMA06},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {89-C},
number = {11},
pages = {1612-1619},
}