Hideyuki Noda, Katsumi Dosaka, Hans Jürgen Mattausch, Tetsushi Koide, Fukashi Morishita, Kazutami Arimoto. A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC. IEICE Transactions, 89-C(11):1612-1619, 2006. [doi]
Abstract is missing.