Ondrej Novák, Zdenek Plíva. Logic testing with test-per-clock pattern loading and improved diagnostic abilities. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 54-59, IEEE, 2017. [doi]
Abstract is missing.