Kevin J. Nowka, Sani R. Nassif, Kanak Agarwal. Characterization and design for variability and reliability. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 341-346, IEEE, 2008. [doi]
Abstract is missing.