Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification - researchr publication authors

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Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye. Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 107-108, IEEE, 2008. [doi]

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