Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye. Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 107-108, IEEE, 2008. [doi]
@inproceedings{OgasaharaHO08,
title = {Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification},
author = {Yasuhiro Ogasahara and Masanori Hashimoto and Takao Onoye},
year = {2008},
doi = {10.1109/ASPDAC.2008.4483917},
url = {http://dx.doi.org/10.1109/ASPDAC.2008.4483917},
researchr = {https://researchr.org/publication/OgasaharaHO08},
cites = {0},
citedby = {0},
pages = {107-108},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
publisher = {IEEE},
}