Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye. Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 107-108, IEEE, 2008. [doi]
Abstract is missing.