Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich. Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 185-190, IEEE Computer Society, 2007.
@inproceedings{OhlerHW07,
title = {Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair},
author = {Philipp Öhler and Sybille Hellebrand and Hans-Joachim Wunderlich},
year = {2007},
tags = {testing},
researchr = {https://researchr.org/publication/OhlerHW07},
cites = {0},
citedby = {0},
pages = {185-190},
booktitle = {Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007},
editor = {Patrick Girard and Andrzej Krasniewski and Elena Gramatová and Adam Pawlak and Tomasz Garbolino},
publisher = {IEEE Computer Society},
isbn = {1-4244-1161-0},
}