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Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair

Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich. Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 185-190, IEEE Computer Society, 2007.

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