A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test - researchr publication authors

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Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger. A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 784-787, IEEE, 2005. [doi]

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