Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger. A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 784-787, IEEE, 2005. [doi]
Abstract is missing.