Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger. A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 784-787, IEEE, 2005. [doi]
@inproceedings{OlletaJCG05,
title = {A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test},
author = {Beatriz Olleta and Hanjun Jiang and Degang Chen and Randall L. Geiger},
year = {2005},
doi = {10.1109/ISCAS.2005.1464705},
url = {http://dx.doi.org/10.1109/ISCAS.2005.1464705},
tags = {testing},
researchr = {https://researchr.org/publication/OlletaJCG05},
cites = {0},
citedby = {0},
pages = {784-787},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan},
publisher = {IEEE},
}