Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis - researchr publication authors

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Sule Ozev, Alex Orailoglu. Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 213-222, IEEE Computer Society, 2002. [doi]

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