Sule Ozev, Alex Orailoglu. Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 213-222, IEEE Computer Society, 2002. [doi]
@inproceedings{OzevO02:0, title = {Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis}, author = {Sule Ozev and Alex Orailoglu}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/vts/2002/1570/00/15700213abs.htm}, tags = {test coverage, testing, analysis, coverage}, researchr = {https://researchr.org/publication/OzevO02%3A0}, cites = {0}, citedby = {0}, pages = {213-222}, booktitle = {20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1570-3}, }