A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients

Hoda Pahlevanzadeh, Qiaoyan Yu. A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. J. Electronic Testing, 30(5):595-609, 2014. [doi]

Authors

Hoda Pahlevanzadeh

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Qiaoyan Yu

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