Hoda Pahlevanzadeh, Qiaoyan Yu. A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. J. Electronic Testing, 30(5):595-609, 2014. [doi]
@article{PahlevanzadehY14-0,
title = {A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients},
author = {Hoda Pahlevanzadeh and Qiaoyan Yu},
year = {2014},
doi = {10.1007/s10836-014-5476-2},
url = {http://dx.doi.org/10.1007/s10836-014-5476-2},
researchr = {https://researchr.org/publication/PahlevanzadehY14-0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {30},
number = {5},
pages = {595-609},
}