A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients

Hoda Pahlevanzadeh, Qiaoyan Yu. A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. J. Electronic Testing, 30(5):595-609, 2014. [doi]

Abstract

Abstract is missing.