Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet - researchr publication authors

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Mingzhi Pan, Hongxia Pan, Xu Xin, Huiling Liu. Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet. In 14th International Conference on Ubiquitous Robots and Ambient Intelligence, URAI 2017, Jeju, South Korea, June 28 - July 1, 2017. pages 788-793, IEEE, 2017. [doi]

This author has not been identified. Look up 'Mingzhi Pan' in GoogleThis author has not been identified. Look up 'Hongxia Pan' in GoogleThis author has not been identified. Look up 'Xu Xin' in GoogleThis author has not been identified. Look up 'Huiling Liu' in Google

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