Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet

Mingzhi Pan, Hongxia Pan, Xu Xin, Huiling Liu. Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet. In 14th International Conference on Ubiquitous Robots and Ambient Intelligence, URAI 2017, Jeju, South Korea, June 28 - July 1, 2017. pages 788-793, IEEE, 2017. [doi]

@inproceedings{PanPXL17,
  title = {Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet},
  author = {Mingzhi Pan and Hongxia Pan and Xu Xin and Huiling Liu},
  year = {2017},
  doi = {10.1109/URAI.2017.7992826},
  url = {https://doi.org/10.1109/URAI.2017.7992826},
  researchr = {https://researchr.org/publication/PanPXL17},
  cites = {0},
  citedby = {0},
  pages = {788-793},
  booktitle = {14th International Conference on Ubiquitous Robots and Ambient Intelligence, URAI 2017, Jeju, South Korea, June 28 - July 1, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-3056-9},
}