A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source With -6 Native Bit Error Rate - researchr publication authors

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Yachun Pang, Bin Gao, Dong Wu, Shengyu Yi, Qi Liu, Wei-Hao Chen, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, He Qian, Meng-Fan Chang, Huaqiang Wu. A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source With -6 Native Bit Error Rate. In IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019. pages 402-404, IEEE, 2019. [doi]

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