Yachun Pang, Bin Gao, Dong Wu, Shengyu Yi, Qi Liu, Wei-Hao Chen, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, He Qian, Meng-Fan Chang, Huaqiang Wu. A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source With -6 Native Bit Error Rate. In IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019. pages 402-404, IEEE, 2019. [doi]
@inproceedings{PangGWYLCCLSYQC19,
title = {A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source With -6 Native Bit Error Rate},
author = {Yachun Pang and Bin Gao and Dong Wu and Shengyu Yi and Qi Liu and Wei-Hao Chen and Ting-Wei Chang and Wei-En Lin and Xiaoyu Sun and Shimeng Yu and He Qian and Meng-Fan Chang and Huaqiang Wu},
year = {2019},
doi = {10.1109/ISSCC.2019.8662307},
url = {https://doi.org/10.1109/ISSCC.2019.8662307},
researchr = {https://researchr.org/publication/PangGWYLCCLSYQC19},
cites = {0},
citedby = {0},
pages = {402-404},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019},
publisher = {IEEE},
isbn = {978-1-5386-8531-0},
}