Hydrogen in MOSFETs - A primary agent of reliability issues

Sokrates T. Pantelides, L. Tsetseris, S. N. Rashkeev, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf. Hydrogen in MOSFETs - A primary agent of reliability issues. Microelectronics Reliability, 47(6):903-911, 2007. [doi]

Abstract

Abstract is missing.