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Christos A. Papachristou, Mikhail Baklashov, Kowen Lai. High-Level Test Synthesis for Behavioral and Structural Designs. J. Electronic Testing, 13(2):167-188, 1998. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: BIST testability enhancement using high level test synthesis for behavioral and structural designsKowen Lai, Christos A. Papachristou, Mikhail Baklashov. ats 1997: 338-342 [doi] High Level Test Synthesis Across the Boundary of Behavioral and Structural DomainsKowen Lai, Christos A. Papachristou, Mikhail Baklashov. iccd 1997: 636-641
The following publications are possibly variants of this publication: