Regressive Testing for System-on-Chip with Unknown-Good-Yield - researchr publication authors

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Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi. Regressive Testing for System-on-Chip with Unknown-Good-Yield. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 393-400, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Noh-Jin Park' in GoogleThis author has not been identified. Look up 'Byoungjae Jin' in GoogleThis author has not been identified. Look up 'K. M. George' in GoogleThis author has not been identified. Look up 'Nohpill Park' in GoogleThis author has not been identified. Look up 'Minsu Choi' in Google

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