Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi. Regressive Testing for System-on-Chip with Unknown-Good-Yield. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 393-400, IEEE Computer Society, 2003. [doi]
@inproceedings{ParkJGPC03,
title = {Regressive Testing for System-on-Chip with Unknown-Good-Yield},
author = {Noh-Jin Park and Byoungjae Jin and K. M. George and Nohpill Park and Minsu Choi},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420393abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ParkJGPC03},
cites = {0},
citedby = {0},
pages = {393-400},
booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2042-1},
}