A partial scan design by unifying structural analysis and testabilities - researchr publication authors

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Jongwook Park, Sang-Hoon Shin, Sungju Park. A partial scan design by unifying structural analysis and testabilities. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 88-91, IEEE, 2000. [doi]

This author has not been identified. Look up 'Jongwook Park' in GoogleThis author has not been identified. Look up 'Sang-Hoon Shin' in GoogleThis author has not been identified. Look up 'Sungju Park' in Google

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