Jongwook Park, Sang-Hoon Shin, Sungju Park. A partial scan design by unifying structural analysis and testabilities. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 88-91, IEEE, 2000. [doi]
Abstract is missing.